Thermoelectric phenomenon is a physical process in which electric current flows by heat diffusion when there exists a temperature gradient in thermoelectric materials such as conductors or semiconductors. Therefore, it is very important to enhance the thermoelectric performance of corresponding material in thermoelectric applications. The performance of thermoelectric material describes how much thermal energy can be directly converted into electrical energy.
Thus, semiconductors whose electrical conductivity and Seebeck coefficient are between conductors and insulators were used in thermoelectric applications. In general, as electrical conductivity and thermal conductivity are proportional to the concentration of carriers such as electrons and phonons, the better the electrical conductivity of material is, the better its thermal conductivity is. However, it is difficult to obtain materials with both high electrical conductivity and low thermal conductivity. Fortunately, the idea that thermal conductivity can be reduced by high entropy design has attracted a great deal of interest of researchers who were making efforts to develop high entropy materials (HEMs) with good thermoelectric property.
Pang Chol Ho, a researcher at the Faculty of Materials Science and Technology, has newly developed an improved residual error non-homogeneous grey model and estimated the thermoelectric performance parameters of high entropy materials (HEMs) using this model.
Firstly, by combining the non-homogeneous grey model, residual error processing method and Markov model, he improved the forecasting accuracy of the model.
Secondly, he performed a comparative analysis of several HEMs using the proposed IRENHGM (1, 1) model and other grey models. The results showed that the Mean Absolute Percentage Error (MAPE) value of the proposed model is less than 0.02, which is the highest in the forecasting accuracy.
For more details, you can refer to his paper “Estimating the Thermoelectric Performance Parameters of High Entropy Materials by the Improved Residual Error Non-homogeneous Grey Model(1, 1)” in “The Journal of Grey System” (SCI).
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